Method and apparatus for determining phase sensitivity of an accelerometer based on an analysis of the harmonic components of the interference signal

ABSTRACT

The present invention relates to a method and apparatus for determining phase sensitivity of an accelerometer based on an analysis of the harmonic components of the interference signal, which can estimate phase lags of an accelerometer through an analysis of the interference signal obtained using a single photo-detector when the accelerometer moves in sinusoidal motion with an initial phase of vibration. The method comprises the steps of obtaining an interference signal in a time domain generated from a signal reflected by an accelerometer and a fixed mirror using a single photo-detector; transforming the interference signal in the time domain into a signal in a frequency domain including a plurality of harmonic signals by Fourier transform; and determining the phase sensitivity of the accelerometer using initial phase of vibration displacement of the accelerometer, which is included in the interference signal in the frequency domain.

TECHNICAL FIELD

The present invention relates to a method and apparatus for determiningphase sensitivity of an accelerometer based on an analysis of theharmonic components of the interference signal, and more particularly,to a method and apparatus for determining phase sensitivity of anaccelerometer based on an analysis of the harmonic components of theinterference signal, which can estimate phase lags of an accelerometerthrough an analysis of the interference signal obtained using a singlephoto-detector when the accelerometer moves in sinusoidal motion with aninitial phase of vibration.

BACKGROUND ART

Vibration is accompanied with all moving objects. There are frequentoccasions when the vibration is not considered in designing machineryand equipment, or a structure. Due to the undesirable vibration,troubles or malfunctions are occurred, and thus additional efforts arerequired for restriction of the vibration. In order to reduce thevibration, it is necessary to grasp a cause of generation of thevibration, a vibration transmission path, a dynamic characteristic ofthe structure and the like, and the measurement of vibration is anessential element in this process. A machine under operation isunavoidably accompanied by vibration, but it is possible to detect achange in state of the machine by monitoring vibration signals, and thusthe measurement of vibration is performed for the purpose of preventingand maintaining damage to the machinery and equipment, or the structure.Recently, as the structures such as a bridge and a building becomelarger and machine parts becomes lighter, a frequency component of thevibration is extended to low and high frequency ranges.

As the necessity for the measurement of vibration over a wide frequencyrange with a high degree of accuracy is increased, calibration of avibration transducer becomes accordingly more important. However, inorder to accurately measure the vibration using an accelerometer, theresponse characteristics of the accelerometer with respect to externalvibration should be known. The accelerometer is an apparatus thattransforms external vibration into electrical output. If an electricaloutput ratio of the accelerometer and a magnitude of the vibrationapplied to the accelerometer are known, then an absolute magnitude ofvibration signal can be accurately measured. This characteristic is themagnitude information of accelerometer sensitivity. There is phase lagbetween the vibration applied to the accelerometer and the electricaloutput from the accelerometer, and the phase lag is phase information ofthe sensitivity of the accelerometer. The phase and magnitude of thesensitivity of the accelerometer is a function of the frequency.

FIG. 1 shows the phase sensitivity and the magnitude of theaccelerometer. The real vibration can be reconstructed completely fromthe measured signal with the magnitude and the phase information of thesensitivity of the accelerometer. The sensitivity of the accelerometeris defined as a ratio of the vibration applied to the accelerometer tothe electrical output from the accelerometer. The sensitivity is acomplex quantity having magnitude and phase and also a function of thefrequency. Calibration of the accelerometer is a process of determiningthe sensitivity of the accelerometer. In order to calibrate theaccelerometer through primary calibration by sinusoidal excitation, theaccelerometer has to be excited by a sinusoidal motion. It is firstnecessary to apply vibration to the accelerometer. Sinusoidal vibrationcan be applied to the accelerometer using an electro-dynamic exciter.The vibration of the accelerometer and the electrical output from theaccelerometer should then be measured during the sinusoidal motion ofthe accelerometer. The vibration of the accelerometer can be measured byvarious methods. However, it is known that the vibration of theaccelerometer can be measured most accurately using a laserinterferometer. The electrical output from the accelerometer can bemeasured using a digital voltmeter or a spectrum analyzer.

Several methods of analyzing the laser interferometer signal can be usedto accurately determine the sensitivity of the accelerometer, includinga Fringe counting method, a Fringe disappearance method, a harmoniccomponents ratio method, a sine-approximation method and the like, butonly the sine-approximation method can estimate the magnitude and thephase.

The sine-approximation method can calibrate the phase and the magnitudeof the sensitivity in the frequency range of 1 Hz˜10 kHz. Also, thesine-approximation method can be used to analyze the interference signalof a homodyne interferometer and a heterodyne interferometer.

The sine-approximation method with the homodyne interferometer shouldconfigure a Michelson interferometer having two quadrature signaloutputs.

FIG. 2 shows an entire configuration of a measuring system using thesine-approximation method. Referring to FIG. 2, the measuring systemincludes a frequency generator 1, a power amplifier 2, a vibrator 3, amoving part of vibrator 4, a dummy mass 5, an accelerator 6, anamplifier 7, an interferometer 8, a laser 9, a photo-detector 10, adigital waveform recorder 11, a voltmeter 12, a distortion meter 13 andan oscilloscope 14. Since a function of each element of the measuringsystem is well known, the description thereof will be omitted.

The measuring system with the sine-approximation method uses twophoto-detectors 10. It is important that phase difference between theoutput signals measured from the interferometer through thephoto-detector 10 is precisely 90°.

If the phase difference between the output signals of the twophoto-detectors 10 is not precisely 90°, an error may be occurred in theestimation of the phase lag in the sine-approximation method.Particularly, when a vibration displacement is less than 0.5 μm, theerror may become more than 0.3°. In order to mitigate this problem, themeasurement error of the quadrature output signals should be corrected.

Also, the interferometer in the sine-approximation method has a morecomplicated configuration than those in other methods. For example,since the sine-approximation method uses the two photo-detectors 10, aquantity of light is reduced comparing with other methods using a singlephoto-detector, and a signal processing procedure is complicated.

When the vibration displacement is in a nanometer range, it isrecommended that the heterodyne interferometer system should beemployed. However, the heterodyne interferometer system is generallymore complicated than the homodyne interferometer system with respect toits configuration, and thus the manufacturing cost is increased.

DISCLOSURE Technical Problem

An object of the present invention is to provide a method of estimatingphase lag of the accelerometer using a single photo-detector. Thepresent invention employs the concept used in a method of calibratingthe magnitude of the sensitivity of the accelerometer based on theharmonic components ratio method.

Heretofore, when analyzing a frequency spectrum of the signal of thephoto-detector, the initial phase of the motion of the accelerometer isnot considered. However, according to the present invention, first, aFourier transform of the interference signal from a Michelsoninterferometer system is derived, where a moving mirror moves insinusoidal motion with given amplitude and initial phase. Second, thephase lag of the accelerometer is estimated based on the Fouriertransform.

Therefore, the present invention can estimate the phase lag of theaccelerometer in a frequency range of 40 Hz˜10 kHz.

Technical Solution

To achieve the above object, the present invention provides a method ofdetermining phase sensitivity of an accelerometer based on an analysisof harmonic components of an interference signal, comprising the stepsof obtaining an interference signal in a time domain generated from asignal reflected by an accelerometer and a fixed mirror using a singlephoto-detector; transforming the interference signal in the time domaininto a signal in a frequency domain including a plurality of harmonicsignals by Fourier transform; and determining the phase sensitivity ofthe accelerometer using initial phase of vibration displacement of theaccelerometer, which is included in the interference signal in thefrequency domain.

Preferably, the step of determining the phase sensitivity comprises thesteps of obtaining an output phase of the accelerometer from a firstharmonic component; determining a linear phase line using a harmonicorder and a measured phase from each harmonic component; determining alinear phase from a phase of points in each harmonic order nearest tothe linear phase line, and determining the initial phase of thevibration displacement by dividing the linear phase by the harmonicorder and averaging the divided phase; and determining phase lag of theaccelerometer from difference between the output phase and the initialphase.

Preferably, the step of determining the linear phase line comprises thesteps of plotting points on a coordinate plane, which are apart form themeasured phases by integer multiples of n; drawing an optional straightline that passes through an origin of the coordinate plane, andcalculating a sum of squared effort (SSE) between the straight line andthe nearest points; and repeating a process of calculating the SSE whilea slop of the straight line is gradually increased stepwise, anddetermining the straight line having a minimum SSE as the linear phaseline.

Preferably, the linear phase line can be expressed by a followingequation, and the slop of the straight line exists between −π and π, andtwo linear phase lines and two initial phases corresponding to eachlinear line exist, and between the two initial phases, the true phase,whose phase difference with the output phase −π of the accelerometer issmaller than 90°, is determined as the initial phase.

Preferably, the method further comprises the step of determiningmagnitude sensitivity of the accelerometer.

Further, the present invention provides an apparatus for determiningphase sensitivity of an accelerometer based on an analysis of harmoniccomponents of an interference signal, comprising a single photo-detectorfor obtaining an interference signal in a time domain generated fromsignal reflected by an accelerometer and a fixed mirror using; a Fouriertransformer for transforming the interference signal in the time domaininto a signal in a frequency domain including a plurality of harmonicsignals; and a phase and magnitude calibrator for determining the phasesensitivity of the accelerometer using initial phase of vibrationdisplacement of the accelerometer, which is included in the interferencesignal in the frequency domain.

Preferably, the phase and magnitude calibrator obtains an output phaseof the accelerometer from a first harmonic component, and determines alinear phase line using a harmonic order and a measured phase from eachharmonic component, and determines a linear phase from a phase of pointsin each harmonic order nearest to the linear phase line, and determinesthe initial phase of the vibration displacement by dividing the linearphase by the harmonic order and averaging the divided phase, anddetermines phase lag of the accelerometer from difference between theoutput phase and the initial phase.

Preferably, the phase and magnitude calibrator determines magnitudesensitivity of the accelerometer together with the phase sensitivity ofthe accelerometer.

Furthermore, the present invention provides a computer-readable mediumstoring a program for executing at least one of the methods.

Advantageous Effects

The present invention can provides a new method of determining the phaselag of the accelerometer based on an analysis of the interference signalobtained using a single photo-detector. In other words, the presentinvention can accurately determine the phase lag of the accelerometer ina frequency range of 40 Hz˜10 kHz.

Further, since the present invention uses a single photo-detector, itdoes not require any additional procedures to correct nonlinear errors,which are likely to arise in the conventional methods using twophoto-detectors.

Further, since the present invention uses the homodyne interferometersystem, it has a very simple construction. For example, a high-speeddata acquisition system like a time interval analyzer is not required.

Further, the signal processing procedures used in the present inventionare simple. Since it does not require other procedures except theFourier transform, the possibility of generating errors is reduced.

Further, if the phase results measured by the present invention areapplied to the valuation of the sensitivity magnitude of theaccelerometer, it is possible to increase the resolution of analysis ofa multi-valued function. The phase measurement method is also useful inevaluating a vibration measurement transducer having a relatively lowresonant frequency.

DESCRIPTION OF DRAWINGS

The above and other objects, features and advantages of the presentinvention will become apparent from the following description ofpreferred embodiments given in conjunction with the accompanyingdrawings, in which:

FIG. 1 is a graph showing phase sensitivity and magnitude of anaccelerometer.

FIG. 2 is a schematic view showing a configuration of a measuring systemusing a conventional sine-approximation method for measuring themagnitude and phase at the same time.

FIG. 3 is a block diagram showing an apparatus for determining phasesensitivity with a single photo-detector according to an embodiment ofthe present invention.

FIG. 4 is a flow chart showing a method of determining phase sensitivityand/or magnitude sensitivity of an accelerometer according to anembodiment of the present invention.

FIG. 5 is a graph showing interference signal generated in aninterferometer when vibration having an optional initial phase isapplied according to an embodiment of the present invention.

FIG. 6 is a graph showing a magnitude of harmonic component when anargument of Bessel function has a small value or a large value accordingto an embodiment of the present invention.

FIG. 7 is a graph showing a relation between a phase of the vibrationdisplacement and a measured phase according to an embodiment of thepresent invention.

FIG. 8 is a graph showing a linear phase line according to an embodimentof the present invention.

FIG. 9 is a graph showing that the linear phase line is expressed by alinear equation (Φ₁+mπ)n according to an embodiment of the presentinvention.

FIG. 10 is a graph showing that the linear phase line indicates a rangeof m in the linear equation (Φ₁+mπ)n according to an embodiment of thepresent invention.

FIG. 11 is a graph showing a method of determining the phase of thevibration displacement according to an embodiment of the presentinvention.

BEST MODE

All technical and scientific terms used herein have the same meaning ascommonly understood by one of ordinary skill in the art to which thisinvention belongs. However, several of the terms may not be generallyunderstood, and general definitions of these terms are provided herein.While it is not intended that the present invention be restricted byshortcomings in these definitions, it is believed helpful to providethese definitions as guidance to those unfamiliar with the terms.

Hereinafter, the embodiments of the present invention will be describedin detail with reference to accompanying drawings.

FIG. 3 shows an apparatus for determining phase sensitivity with asingle photo-detector according to an embodiment of the presentinvention. Referring to FIG. 3, the apparatus for determining the phasesensitivity comprises an accelerometer 100, a vibration exciter 200, alaser generator 300, a beam splitter 400, a fixed mirror 500, aphoto-detector 600, a signal conditioner 700, a power amplifier 800, anA/D converter 910, 920, a D/A converter 930, a Fourier transformer 1010and a phase and magnitude calibrator 1020.

The vibration exciter 200 generates vibration having a given frequency,and the accelerometer 100 disposed at the vibration exciter 200 isvibrated at the given frequency. A laser beam generated from the lasergenerator 300 is split in the beam splitter 400, and a part of the laserbeam (hereinafter, “first split laser beam”) is reflected on the fixedmirror 500 and then incident again on the beam splitter 400, and otherpart of the laser beam (hereinafter, “second split laser beam”) isreflected on an upper surface of the accelerometer 100 and then incidentagain on the beam splitter 400. The first and second split laser beamsare incident to the photo-detector 600 via the beam splitter 400, andthe photo-detector 600 measures interference signal of each first andsecond split laser beam.

The present invention estimates the sensitivity of phase and/ormagnitude of the accelerometer 100 using the photo-detector 600. Theinterference signal is passed through the A/D converter 910 and thentransformed into a signal having a frequency range at the Fouriertransformer 1010. In the present invention, the Fourier transform methodis used to transform the interference signal into the signal in afrequency domain. However, the present invention is not limited to themethod, and may further include other transform methods of transformingthe interference signal into the signal in the frequency domain. Thephase and magnitude calibrator 1020 estimates the phase sensitivity andthe magnitude sensitivity of the transformed interference signal.

FIG. 4 is a flow chart showing a method of determining the phasesensitivity and/or magnitude sensitivity of the accelerometer accordingto an embodiment of the present invention. Referring to FIG. 4 a, first,an interference signal in a time domain is obtained using the singlephoto-detector 600 (S410). As described above, the interference signalis generated from the signal reflected by the vibrated accelerometer 100and fixed mirror 500.

Then, the interference signal is converted into a digital signal by theA/D converter 910 and transformed into the signal in the frequencydomain by the Fourier transformer 1010, and harmonic components of theinterference signal in the frequency domain is obtained (S420). And thephase and magnitude calibrator 1020 determines the phase sensitivityand/or the magnitude sensitivity of the accelerometer 100 using theharmonic components (S430). The present invention can determine thephase sensitivity and/or the magnitude sensitivity of the accelerometer100 at the same time, or determine only the phase sensitivity of theaccelerometer 100.

FIG. 4 b is a flow chart showing a method of determining the phasesensitivity of the accelerometer. First, an output phase of theaccelerometer 100 is determined (S431), a linear phase line isdetermined (S432), a linear phase and a vibration phase of theaccelerometer are determined (S432), and a phase lag of theaccelerometer 100 is determined (S433).

Now, the detailed description will be provided.

A moving mirror 110 is bonded on an upper surface of the accelerometer.The moving mirror 110 moved in a sinusoidal notion together with theaccelerometer. The motion of the accelerometer can be defined by thefollowing equation 1:

s=ŝ cos(2πf ₁ t+φ ₁)  [Equation 1]

where s is a displacement in m, ŝ is a magnitude of the displacement inm,

$f_{1} = \frac{\omega_{1}}{2\pi}$

is a frequency of vibration in Hz, ω₁ is an angular frequency in rad/s,and Φ₁ is an initial phase of displacement in rad. The intensity of theinterference signal measured by the photo-detector 600 can be defined bythe following equation 2:

$\begin{matrix}{{I(t)} = {A + {B\; {\cos \left\lbrack {\frac{4\pi}{\lambda}\left\{ {{\hat{s}\; {\cos \left( {{2\pi \; f_{1}t} + \varphi_{1}} \right)}} + L} \right\}} \right\rbrack}}}} & \left\lbrack {{Equation}\mspace{14mu} 2} \right\rbrack\end{matrix}$

where λ is a wavelength of the laser beam in m, L is an optical pathlength difference in m and A, B are constants. A generating function forBessel functions in series form can be expressed by the followingequation 3:

$\begin{matrix}{{\exp \left\lbrack {j\frac{\hat{x}}{2}\left( {v - \frac{1}{v}} \right)} \right\rbrack} = {\sum\limits_{n = {- \infty}}^{\infty}{{J_{n}\left( \hat{x} \right)}v^{n}}}} & \left\lbrack {{Equation}\mspace{14mu} 3} \right\rbrack\end{matrix}$

where J_(n) is a nth-order Bessel function. Variables in the equation 3can be expressed by the following equations 4 and 5:

$\begin{matrix}{\hat{x} = \frac{4\pi \; \hat{s}}{\lambda}} & \left\lbrack {{Equation}\mspace{14mu} 4} \right\rbrack \\{v = {\exp \left\lbrack {j\left( {{2\pi \; f_{1}t} + \varphi_{1}} \right)} \right\rbrack}} & \left\lbrack {{Equation}\mspace{14mu} 5} \right\rbrack\end{matrix}$

If the equations 3 to 5 are substituted in the equation 2, the intensitycan be expressed by the following equation 6:

$\begin{matrix}{{I(t)} = {A + {B{\sum\limits_{n = {- \infty}}^{\infty}{{J_{n}\left( \frac{4\; \pi \; \hat{s}}{\lambda} \right)}{\cos \left( {\frac{4\pi \; L}{\lambda} + {\frac{n}{2}\pi}} \right)} \times {\exp \left( {j\; n\; \varphi_{1}} \right)}{\exp \left( {j\; 2\pi \; {nf}_{1}t} \right)}}}}}} & \left\lbrack {{Equation}\mspace{14mu} 6} \right\rbrack\end{matrix}$

The Fourier transform of the equation 6 becomes as follows:

$\begin{matrix}{{I(f)} = {{A\; {\delta (f)}} + {B{\sum\limits_{n = {- \infty}}^{\infty}{{J_{n}\left( \frac{4\pi \; \hat{s}}{\lambda} \right)}{\cos \left( {{\frac{n}{2}\pi} + \frac{4\pi \; L}{\lambda}} \right)} \times {\exp \left( {j\; n\; \varphi_{1}} \right)}{\delta \left( {f - {nf}_{1}} \right)}}}}}} & \left\lbrack {{Equation}\mspace{14mu} 7} \right\rbrack\end{matrix}$

If the equation 7 is decomposed into even and odd terms, it can beexpressed by the following equation 8:

$\begin{matrix}{{I(f)} = {{A\; {\delta (f)}} + {B\; {\cos \left( \frac{4\pi \; L}{\lambda} \right)}{\sum\limits_{m = {- \infty}}^{\infty}{\left( {- 1} \right)^{m}{J_{2m}\left( \frac{4\pi \; \hat{s}}{\lambda} \right)} \times {\exp \left( {j\; 2m\; \varphi_{1}} \right)}{\delta \left( {f - {2{mf}_{1}}} \right)}}}} + {B\; {\sin \left( \frac{4\pi \; L}{\lambda} \right)}{\sum\limits_{m = {- \infty}}^{\infty}{\left( {- 1} \right)^{m}{J_{{2m} - 1}\left( \frac{4\; \pi \; \hat{s}}{\lambda} \right)} \times {\exp \left\lbrack {{j\left( {{2m} - 1} \right)}\varphi_{1}} \right\rbrack}\delta \left\{ {f - {\left( {{2m} - 1} \right)f_{1}}} \right\}}}}}} & \left\lbrack {{Equation}\mspace{14mu} 8} \right\rbrack\end{matrix}$

where δ( ) is a delta function,

$J_{n}\left( \frac{4\pi \; \hat{s}}{\lambda} \right)$

is the nth-Bessel function, and n, m are integers. Equations 7 and 8show that the displacement amplitude appears at the magnitude of thespectrum of the interference signal and the initial phase of thesinusoidal displacement appears at the phase component of the spectrum,respectively.

Hereinafter, properties of the spectrum of the interference signal willbe described.

The equation 7 indicates that the spectrum of the interference signalconsists of infinite harmonic components having an exciting frequency asfundamental frequency. However, even or odd harmonic components mayappear dominantly according to the magnitude of the optical path lengthdifference.

The equation 8 shows that the even harmonic components only appear when

${L = {\frac{\lambda}{4}k}},{k = 0},{\pm 1},{\pm 2},\ldots \mspace{14mu},$

and the odd harmonic components only appear when

${L = {{\frac{\lambda}{4}k} + \frac{\lambda}{8}}},{k = 0},{\pm 1},{\pm 2},{\ldots \mspace{14mu}.}$

For example, when the optical path length difference is changed by

$\frac{\lambda}{8}$

in a test, the Fourier transform of the interference signal measured atthis time shows that the even and odd harmonic components appearalternately.

FIG. 5 shows simulation results of change in the interference signalgenerated from the interferometer, when vibration having an optionalinitial phase is applied at a frequency of 40 Hz and an acceleration of50 m/s², in the case that the optical path length difference isincreased stepwise by

$\frac{\lambda}{16}$

each time from zero, wherein FIG. 5 a shows that the even harmoniccomponents only appear in the case that the optical path lengthdifference is zero, FIG. 5 b shows that the even and odd harmoniccomponents appear all together and FIG. 5 c shows that the odd harmoniccomponents only appear. These processes are repeated, and then theinterference signal that is identical with the original one is obtainedwhen the optical path length difference is

$\frac{\lambda}{2}.$

Bessel functions appear in each term of the equation 7 with theexception of the DC term. In addition, the argument of the Besselfunction,

$\frac{4\pi \; \overset{̑}{s}}{\lambda},$

is directly proportional to the amplitude of the sinusoidal displacementŝ.

If the amplitude of the displacement becomes small, the argument of theBessel function,

$\frac{4\pi \overset{̑}{s}}{\lambda},$

will also become small.

FIG. 6 a shows that the harmonic components of few lower orders have arelatively large magnitude in the region that

$\frac{4\pi \overset{̑}{s}}{\lambda}$

is small, and FIG. 6 b the harmonic components have the same magnitudein the region that

$\frac{4\pi \overset{̑}{s}}{\lambda}$

is large. The equation 7 shows that the interference signal spectrum hasthe harmonic components having the relatively large magnitude in the fewlower orders.

As the amplitude of the displacement increases, the argument of theBessel function increases. In this range, the Bessel functions can beapproximated as the following equation 9:

$\begin{matrix}{{J_{n}(x)} \approx {\sqrt{\frac{2}{\pi \; x}}{\cos \left( {x - \frac{n\; \pi}{2} - \frac{\pi}{4}} \right)}}} & \left\lbrack {{Equation}\mspace{14mu} 9} \right\rbrack\end{matrix}$

If the equation 9 is substituted into the equation 8 and the even andodd terms are given as I_(2m′)I_(2m-1), it can be expressed by thefollowing equations 10 and 11.

$\begin{matrix}{I_{2m} = {B\; {\cos \left( \frac{4\pi \; L}{\lambda} \right)}\sqrt{\frac{\lambda}{2\pi^{2}\overset{̑}{s}}}{\cos \left( {\frac{4\pi \overset{̑}{s}}{\lambda} - \frac{\pi}{4}} \right)}{\exp \left( {{j2}\; m\; \varphi_{1}} \right)}}} & \left\lbrack {{Equation}\mspace{14mu} 10} \right\rbrack \\{I_{{2m} - 1} = {B\; {\cos \left( \frac{4\pi \; L}{\lambda} \right)}\sqrt{\frac{\lambda}{2\pi^{2}\overset{̑}{s}}}{\sin \left( {\frac{4\pi \overset{̑}{s}}{\lambda} - \frac{\pi}{4}} \right)}{\exp \left\lbrack {{j\left( {{2\; m} - 1} \right)}\; \varphi_{1}} \right\rbrack}}} & \left\lbrack {{Equation}\mspace{14mu} 11} \right\rbrack\end{matrix}$

The equations 10 and 11 show that all even and odd harmonic componentshave the same magnitude independent of their harmonic order, if thevibration displacement ŝ or the acceleration

${\overset{̑}{a}}_{rms} = \frac{\overset{̑}{s}\omega_{1}^{2}}{\sqrt{2}}$

corresponding to the displacement is given.

In the equations 10 and 11, if

${\overset{̑}{s} = {\frac{\lambda}{16} + {\frac{\lambda}{4}k}}},{k = 0},1,2,\ldots \mspace{14mu},$

only even harmonic spectrum components exist. And if

${\overset{̑}{s} = {\frac{3\lambda}{16} + {\frac{\lambda}{4}k}}},{k = 0},1,2,\ldots \mspace{14mu},$

only odd harmonic spectrum components exist.

That is, if

${\overset{̑}{s} = {\frac{\lambda}{16} + {\frac{\lambda}{8}k}}},{k = 0},1,2,\ldots \mspace{14mu},$

only the even or odd harmonic spectrum components exist. In addition,whenever the displacement ŝ is increased, the even and odd harmonicspectrum components appear alternately. An acceleration incrementΔâ_(rms) corresponding to a displacement increment can be calculated bythe following equation 12:

$\begin{matrix}{{\Delta \; {\overset{̑}{a}}_{rms}} = {\frac{\pi^{2}\lambda}{2\sqrt{2}}f_{1}^{2}}} & \left\lbrack {{Equation}\mspace{14mu} 12} \right\rbrack\end{matrix}$

where f₁ is a vibration frequency in Hz. From the equation 12, it can beunderstood that the acceleration increment that the even and oddharmonic spectrum components appear alternately is changed according tothe vibration frequency. The acceleration increments calculated by theequation are 0.00353 m/s² at a frequency of 40 Hz, 0.0141 m/s² at afrequency of 80 Hz, 0.0565 m/s² at a frequency of 160 Hz, 0.219 m/s² ata frequency of 315 Hz, 0.876 m/s² at a frequency of 630 Hz, 3.45 m/s² ata frequency of 1.25 kHz, 13.8 m/s² at a frequency of 2.5 kHz and thelike. Thus, it can be understood that, as the vibration frequencyincreases, the acceleration increment increases. Whenever theacceleration is changed by a value calculated at each frequency, theeven and odd harmonic spectrum components appear alternately. As thetesting frequency is reduced, the change of the even and odd harmonicspectrum components is increased if the acceleration is changed only alittle. For example, in the spectrum of the interference signal that theeven harmonic components appeared dominantly, the two components mayappear at the same time, or the odd harmonic components may appeardominantly.

In the equation 7, if a phase of the vibration displacement Φ₁ is given,the phase of the spectrum of the interference signal becomes nΦ₁ if thesign of

${J_{n}\left( \frac{4\pi \overset{̑}{s}}{\lambda} \right)}{\cos \left( {{\frac{n}{2}\pi} + \frac{4\pi \; L}{\lambda}} \right)}$

is positive, or nΦ₁+π if the sign of

${J_{n}\left( \frac{4\pi \overset{̑}{s}}{\lambda} \right)}{\cos \left( {{\frac{n}{2}\pi} + \frac{4\pi \; L}{\lambda}} \right)}$

is negative. The measured phases Φ_(M,n) in each harmonic order aregiven as principal values. FIG. 7 shows a relation between the vibrationphase Φ₁ and the measured phase Φ_(M,n). In the following, procedures tofind the phase nΦ₁ from the measured phase Φ_(M,n) and then find thephase of the vibration displacement Φ₁ and the phase of the accelerationΦ₁−π from the result will be described.

The method of determining the phase sensitivity of the accelerometer isas follows:

First, an output phase of the accelerometer is determined.

The output phase Φ₂ can be obtained by its Fourier transform and bymeasuring the phase of the first harmonic component. If π is subtractedfrom the measured value, the output phase corresponding to thedisplacement signal can be obtained.

Second, a linear phase line is determined. From the equation 7, thelinear phase Φ_(L) is defined as a function of the harmonic order n bythe following equation 13:

Φ_(L)=Φ₁ ·n  [Equation 13]

where n is an integer. In the equation 13, the harmonic order n isdirectly proportional to the linear phase Φ_(L). If the equation 13having n and Φ_(L) as an independent variable and a dependent variableare plotted on a coordinate plane, a straight line that passes throughthe origin and has the phase Φ₁ of the sinusoidal displacement as aslope can be obtained.

The straight line is defined as the linear phase line.

Since the initial phase Φ₁ of the vibration displacement is a value thatexists between −π and π, the linear phase line also exists between twostraight lines, Φ=±πn, as shown in FIG. 8.

The measured phases Φ_(M,n) are given as principal values that are existbetween −π and π. The linear phase Φ_(L) has to exist somewhere apartform the measured phases Φ_(M,n) by integer multiples of π. All possiblepoints for the linear phase can be shown on the coordinate plane. Thelinear phase line is the straight line that passes the origin and has toexist between two straight lines Φ=±πn.

FIG. 9 shows that the linear phase line can be expressed by (Φ₁+mπ)n,where m=0, ±1, ±2, . . . . Since the linear equation has to existbetween two straight lines Φ=±πn, −π≦Φ₁+mπ≦π can be obtained, and m canbe expressed by the following equation 14:

$\begin{matrix}{{{{- \frac{1}{\pi}}\varphi_{1}} - 1} \leq m \leq {{{- \frac{1}{\pi}}\varphi_{1}} + 1}} & \left\lbrack {{Equation}\mspace{14mu} 14} \right\rbrack\end{matrix}$

where −π≦Φ₁≦π can be obtained, since the initial phase is given as theprincipal value.

FIG. 10 shows the equation 14. In FIG. 10, it can be understood that mhas values of 0 and −1, or 0 and 1 if the initial phase Φ₁ is given. If0≦Φ₁, m has values of 0 and −1, and if Φ₁<0, m has values of 0 and 1.Two straight lines exist that fulfill this condition and they have adifference in slope of π from each other. FIG. 9 is a graph in the caseof 0≦Φ₁.

In order to obtain these straight lines from test data, an optional linethat passes through the origin is drawn, and then a sum of squaredeffort (SSE) between the straight line and the nearest points iscalculated. After the process is repeated while the slop of the straightline is gradually increased stepwise from −π to π, the straight linehaving the minimum SSE is the linear phase line. The SSE will be zero inan ideal case.

Third, the liner phase Φ_(L) and the phase Φ₁ of the vibrationdisplacement are determined.

If points (in theory, points on the linear line) in each harmonic ordernearest to the linear phase line is determined, the phase at everyharmonic order corresponding to the points becomes the linear phaseΦ_(L). The phase at each harmonic order can be determined by dividingthis linear phase by its harmonic order n, and then the initial phase Φ₁of the sinusoidal displacement at each harmonic order can be determinedby averaging the phase.

FIG. 11 shows the method of determining the initial phase Φ₁ of thesinusoidal displacement. Since two linear phase lines exist, twodisplacement phases Φ₁ exist. Between the two displacement phases, itcan select as the displacement phase Φ₁ the true phase whose phasedifference with phase Φ₂−π obtained by twice integrating the outputsignal of the accelerometer is smaller than 90°.

The reason for the determination as described above is as follows. Ingeneral, an accelerometer is used in a frequency range lower than thenatural frequency and calibrated in this frequency range. For example,the tested accelerometer has a natural frequency of about 40 kHz and acalibration range of 40 Hz to 10 Hz, which are significantly lower thanthe natural frequency of the accelerometer. The phase lag between theinput and output of the system is physically smaller than 90° in afrequency range lower than the natural frequency of the system.Therefore, if the test is performed in a frequency range that issufficiently smaller than the natural frequency, the phase lag betweenthe sinusoidal acceleration input to the accelerometer and the outputvoltage of the accelerometer, or between the displacement phase input tothe accelerometer and the signal obtained by twice integrating theoutput of the accelerometer has a value that is smaller than 90°, i.e.,near 0°. Reversely, the phase lag has a value that is larger than 90° inthe frequency range higher than the natural frequency.

The phase Φ₁ of the sinusoidal displacement can be determined from themeasured phases Φ_(M,n) in this way.

Fourth, the phase lag of the accelerometer is determined.

The phase lag of the accelerometer can be determined from the differencebetween the phase of the accelerometer output Φ₂ and the initial phaseΦ₁−π of the acceleration applied to the accelerometer.

Those skilled in the art will appreciate that the conceptions andspecific embodiments disclosed in the foregoing description may bereadily utilized as a basis for modifying or designing other embodimentsfor carrying out the same purposes of the present invention. Thoseskilled in the art will also appreciate that such equivalent embodimentsdo not depart from the spirit and scope of the invention as set forth inthe appended claims.

For example, the present invention can be used to determine the phaselag of transducers for measuring linear vibration, such as a speedtransducer and a displacement transducer, and transducers for measuringrotational vibration, such as an angular accelerometer, an angularsensor and an angular displacement sensor, using the laserinterferometer. In the same manner, the present invention can be alsoused to determine the phase properties of a microphone or a hydrophoneusing the laser interferometer.

INDUSTRIAL APPLICABILITY

According to the present invention, it is possible to provide a newmethod of determining the phase lag of the accelerometer based on ananalysis of the interference signal obtained using a singlephoto-detector. In other words, the present invention can accuratelydetermine the phase lag of the accelerometer in a frequency range of 40Hz˜10 kHz.

Further, if the phase results measured by the present invention areapplied to the valuation of the sensitivity magnitude of theaccelerometer, it is possible to increase the resolution of analysis ofa multi-valued function. The phase measurement method is also useful inevaluating a vibration measurement transducer having a relatively lowresonant frequency.

1. A method of determining phase sensitivity of an accelerometer basedon an analysis of harmonic components of an interference signal,comprising the steps of: obtaining an interference signal in a timedomain generated from a signal reflected by an accelerometer and a fixedmirror using a single photo-detector; transforming the interferencesignal in the time domain into a signal in a frequency domain includinga plurality of harmonic signals by Fourier transform; and determiningthe phase sensitivity of the accelerometer using initial phase ofvibration displacement of the accelerometer, which is included in theinterference signal in the frequency domain.
 2. The method according toclaim 1, wherein the step of determining the phase sensitivity comprisesthe steps of: obtaining an output phase of the accelerometer from afirst harmonic component; determining a linear phase line using aharmonic order and a measured phase from each harmonic component;determining a linear phase from a phase of points in each harmonic ordernearest to the linear phase line, and determining the initial phase ofthe vibration displacement by dividing the linear phase by the harmonicorder and averaging the divided phase; and determining phase lag of theaccelerometer from difference between the output phase and the initialphase.
 3. The method according to claim 2, wherein the step ofdetermining the linear phase line comprises the steps of: plottingpoints on a coordinate plane, which are apart form the measured phasesby integer multiples of π; drawing an optional straight line that passesthrough an origin of the coordinate plane, and calculating a sum ofsquared effort (SSE) between the straight line and the nearest points;and repeating a process of calculating the SSE while a slop of thestraight line is gradually increased stepwise, and determining thestraight line having a minimum SSE as the linear phase line.
 4. Themethod according to claim 3, wherein the linear phase line can beexpressed by a following equation, and the slop of the straight lineexists between −π and π,Φ_(L)=Φ₁ ·n[Equation] where Φ_(L) is the linear phase line, Φ₁ is theinitial phase, n is harmonic order, and m=0, ±1, ±2, . . . .
 5. Themethod according to claim 2, wherein two linear phase lines and twoinitial phases corresponding to each linear line exist, and between thetwo initial phases, the true phase, whose phase difference with theoutput phase −π of the accelerometer is smaller than 90°, is determinedas the initial phase.
 6. The method according to claim 1, furthercomprising the step of determining magnitude sensitivity of theaccelerometer.
 7. An apparatus for determining phase sensitivity of anaccelerometer based on an analysis of harmonic components of aninterference signal, comprising: a single photo-detector for obtainingan interference signal in a time domain generated from signal reflectedby an accelerometer and a fixed mirror using; a Fourier transformer fortransforming the interference signal in the time domain into a signal ina frequency domain including a plurality of harmonic signals; and aphase and magnitude calibrator for determining the phase sensitivity ofthe accelerometer using initial phase of vibration displacement of theaccelerometer, which is included in the interference signal in thefrequency domain.
 8. The apparatus according to claim 7, wherein thephase and magnitude calibrator obtains an output phase of theaccelerometer from a first harmonic component, and determines a linearphase line using a harmonic order and a measured phase from eachharmonic component, and determines a linear phase from a phase of pointsin each harmonic order nearest to the linear phase line, and determinesthe initial phase of the vibration displacement by dividing the linearphase by the harmonic order and averaging the divided phase, anddetermines phase lag of the accelerometer from difference between theoutput phase and the initial phase.
 9. The apparatus according to claim7, wherein the phase and magnitude calibrator determines magnitudesensitivity of the accelerometer together with the phase sensitivity ofthe accelerometer.
 10. A computer-readable medium storing a program forexecuting the method according to claim
 1. 11. A computer-readablemedium storing a program for executing the method according to claim
 212. A computer-readable medium storing a program for executing themethod according to claim 3
 13. A computer-readable medium storing aprogram for executing the method according to claim 4
 14. Acomputer-readable medium storing a program for executing the methodaccording to claim 5
 15. A computer-readable medium storing a programfor executing the method according to claim 6